Energy-dispersive X-ray diffraction (EDXRD) is an analytical technique for characterizing materials. It differs from conventional X-ray diffraction by using polychromatic photons as the source and is usually operated at a fixed angle. With no need for a goniometer, EDXRD is able to collect full diffraction patterns very quickly. EDXRD is almost exclusively used with synchrotron radiation which allows for measurement within real engineering materials.
Energy-dispersive X-ray diffraction Wikipedia
EDXRD was originally proposed independently by Buras et al. and Giessen and Gordon in 1968.Fixed scattering angle – The fixed scattering angle geometry makes EDXRD especially suitable for in situ studies in special environments (e.g. under very low or high temperatures and/or pressures). When the EDXRD method is used, only one entrance and one exit window are needed.
Works directly in reciprocal space – The fixed scattering angle also allows for measurement of the diffraction vector directly. This allows for high-accuracy measurement of lattice parameters.
Fast collection time – Allows for rapid structure analysis and able to study materials that are unstable and only exist for short periods of time
Parallel data collection – Because the whole spectrum of diffracted radiation is obtained simultaneously, it enables studies where structural changes can be determined over time.