List of materials analysis methods

A

Analytical ultracentrifugation - Analytical ultracentrifugation

AAS - Atomic absorption spectroscopy

AED - Auger electron diffraction

AES - Auger electron spectroscopy

AFM - Atomic force microscopy

AFS - Atomic fluorescence spectroscopy

APFIM - Atom probe field ion microscopy

APS - Appearance potential spectroscopy

ARPES - Angle resolved photoemission spectroscopy

ARUPS - Angle resolved ultraviolet photoemission spectroscopy

ATR - Attenuated total reflectance

B

BET - BET surface area measurement (BET from Brunauer, Emmett, Teller)

BiFC - Bimolecular fluorescence complementation

BKD - Backscatter Kikuchi diffraction, see EBSD

BRET - Bioluminescence resonance energy transfer

BSED - Back scattered electron diffraction, see EBSD

C

CAICISS - Coaxial impact collision ion scattering spectroscopy

CARS - Coherent anti-Stokes Raman spectroscopy

CBED - Convergent beam electron diffraction

CCM - Charge collection microscopy

CDI - Coherent diffraction imaging

CE - Capillary electrophoresis

CET - Cryo-electron tomography

CL - Cathodoluminescence

CLSM - Confocal laser scanning microscopy

COSY - Correlation spectroscopy

Cryo-EM - Cryo-electron microscopy

Cryo-SEM - Cryo-scanning electron microscopy

CV - Cyclic voltammetry

D

DE(T)A - Dielectric thermal analysis

dHvA - De Haas–van Alphen effect

DIC - Differential interference contrast microscopy

Dielectric spectroscopy - Dielectric spectroscopy

DLS - Dynamic light scattering

DLTS - Deep-level transient spectroscopy

DMA - Dynamic mechanical analysis

DPI - Dual polarisation interferometry

DRS - Diffuse reflection spectroscopy

DSC - Differential scanning calorimetry

DTA - Differential thermal analysis

DVS - Dynamic vapour sorption

E

EBIC - Electron beam induced current (and see IBIC: ion beam induced charge)

EBS - Elastic (non-Rutherford) backscattering spectrometry (see RBS)

EBSD - Electron backscatter diffraction

ECOSY - Exclusive correlation spectroscopy

ECT - Electrical capacitance tomography

EDAX - Energy-dispersive analysis of x-rays

EDMR - Electrically detected magnetic resonance, see ESR or EPR

EDS or EDX - Energy dispersive X-ray spectroscopy

EELS - Electron energy loss spectroscopy

EFTEM - Energy filtered transmission electron microscopy

EID - Electron induced desorption

EIT and ERT - Electrical impedance tomography and Electrical resistivity tomography

EL - Electroluminescence

Electron crystallography - Electron crystallography

ELS - Electrophoretic light scattering

ENDOR - Electron nuclear double resonance, see ESR or EPR

EPMA - Electron probe microanalysis

EPR - Electron paramagnetic resonance spectroscopy

ERD or ERDA - Elastic recoil detection or Elastic recoil detection analysis

ESCA - Electron spectroscopy for chemical analysis* see XPS

ESD - Electron stimulated desorption

ESEM - Environmental scanning electron microscopy

ESI-MS or ES-MS - Electrospray ionization mass spectrometry or Electrospray mass spectrometry

ESR - Electron spin resonance spectroscopy

ESTM - Electrochemical scanning tunneling microscopy

EXAFS - Extended X-ray absorption fine structure

EXSY - Exchange spectroscopy

F

FCS - Fluorescence correlation spectroscopy

FCCS - Fluorescence cross-correlation spectroscopy

FEM - Field emission microscopy

FIB - Focused ion beam microscopy

FIM-AP - Field ion microscopy–atom probe

Flow birefringence - Flow birefringence

Fluorescence anisotropy - Fluorescence anisotropy

FLIM - Fluorescence lifetime imaging

Fluorescence microscopy - Fluorescence microscopy

FOSPM - Feature-oriented scanning probe microscopy

FRET - Fluorescence resonance energy transfer

FRS - Forward Recoil Spectrometry, a synonym of ERD

FTICR or FT-MS - Fourier transform ion cyclotron resonance or Fourier transform mass spectrometry

FTIR - Fourier transform infrared spectroscopy

G

GC-MS - Gas chromatography-mass spectrometry

GDMS - Glow discharge mass spectrometry

GDOS - Glow discharge optical spectroscopy

GISAXS - Grazing incidence small angle X-ray scattering

GIXD - Grazing incidence X-ray diffraction

GIXR - Grazing incidence X-ray reflectivity

GLC - Gas-liquid chromatography

H

HAADF - high angle annular dark-field imaging

HAS - Helium atom scattering

HPLC - High performance liquid chromatography

HREELS - High resolution electron energy loss spectroscopy

HREM - High-resolution electron microscopy

HRTEM - High-resolution transmission electron microscopy

HI-ERDA - Heavy-ion elastic recoil detection analysis

HE-PIXE - High-energy proton induced X-ray emission

I

IAES - Ion induced Auger electron spectroscopy

IBA - Ion beam analysis

IBIC - Ion beam induced charge microscopy

ICP-AES - Inductively coupled plasma atomic emission spectroscopy

ICP-MS - Inductively coupled plasma mass spectrometry

Immunofluorescence - Immunofluorescence

ICR - Ion cyclotron resonance

IETS - Inelastic electron tunneling spectroscopy

IGA - Intelligent gravimetric analysis

IGF - Inert gas fusion

IIX - Ion induced X-ray analysis: See Particle induced X-ray emission

INS - Ion neutralization spectroscopy
Inelastic neutron scattering

IRNDT - Infrared non-destructive testing of materials

IRS - Infrared spectroscopy

ISS - Ion scattering spectroscopy

ITC - Isothermal titration calorimetry

IVEM - Intermediate voltage electron microscopy

L

LALLS - Low-angle laser light scattering

LC-MS - Liquid chromatography-mass spectrometry

LEED - Low-energy electron diffraction

LEEM - Low-energy electron microscopy

LEIS - Low-energy ion scattering

LIBS - Laser induced breakdown spectroscopy

LOES - Laser optical emission spectroscopy

LS - Light (Raman) scattering

M

MALDI - Matrix-assisted laser desorption/ionization

MBE - Molecular beam epitaxy

MEIS - Medium energy ion scattering

MFM - Magnetic force microscopy

MIT - Magnetic induction tomography

MPM - Multiphoton fluorescence microscopy

MRFM - Magnetic resonance force microscopy

MRI - Magnetic resonance imaging

MS - Mass spectrometry

MS/MS - Tandem mass spectrometry

MSGE - Mechanically Stimulated Gas Emission

Mössbauer spectroscopy - Mössbauer spectroscopy

MTA - Microthermal analysis

N

NAA - Neutron activation analysis

Nanovid microscopy - Nanovid microscopy

ND - Neutron diffraction

NDP - Neutron depth profiling

NEXAFS - Near edge X-ray absorption fine structure

NIS - Nuclear inelastic scattering/absorption

NMR - Nuclear magnetic resonance spectroscopy

NOESY - Nuclear Overhauser effect spectroscopy

NRA - Nuclear reaction analysis

NSOM - Near-field optical microscopy

O

OBIC - Optical beam induced current

ODNMR - Optically detected magnetic resonance, see ESR or EPR

OES - Optical emission spectroscopy

Osmometry - Osmometry

P

PAS - Positron annihilation spectroscopy

Photoacoustic spectroscopy - Photoacoustic spectroscopy

PAT or PACT - Photoacoustic tomography or photoacoustic computed tomography

PAX - Photoemission of adsorbed xenon

PC or PCS - Photocurrent spectroscopy

Phase contrast microscopy - Phase contrast microscopy

PhD - Photoelectron diffraction

PD - Photodesorption

PDEIS - Potentiodynamic electrochemical impedance spectroscopy

PDS - Photothermal deflection spectroscopy

PED - Photoelectron diffraction

PEELS - parallel electron energy loss spectroscopy

PEEM - Photoemission electron microscopy (or photoelectron emission microscopy)

PES - Photoelectron spectroscopy

PINEM - photon-induced near-field electron microscopy

PIGE - Particle (or proton) induced gamma-ray spectroscopy, see Nuclear reaction analysis

PIXE - Particle (or proton) induced X-ray spectroscopy

PL - Photoluminescence

Porosimetry - Porosimetry

Powder diffraction - Powder diffraction

PTMS - Photothermal microspectroscopy

PTS - Photothermal spectroscopy

Q

QENS - Quasielastic neutron scattering

R

Raman - Raman spectroscopy

RAXRS - Resonant anomalous X-ray scattering

RBS - Rutherford backscattering spectrometry

REM - Reflection electron microscopy

RDS - Reflectance Difference Spectroscopy

RHEED - Reflection high energy electron diffraction

RIMS - Resonance ionization mass spectrometry

RIXS - Resonant inelastic X-ray scattering

RR spectroscopy - Resonance Raman spectroscopy

S

SAD - Selected area diffraction

SAED - Selected area electron diffraction

SAM - Scanning Auger microscopy

SANS - Small angle neutron scattering

SAXS - Small angle X-ray scattering

SCANIIR - Surface composition by analysis of neutral species and ion-impact radiation

SCEM - Scanning confocal electron microscopy

SE - Spectroscopic ellipsometry

SEC - Size exclusion chromatography

SEIRA - Surface enhanced infrared absorption spectroscopy

SEM - Scanning electron microscopy

SERS - Surface enhanced Raman spectroscopy

SERRS - Surface enhanced resonance Raman spectroscopy

SEXAFS - Surface extended X-ray absorption fine structure

SICM - Scanning ion-conductance microscopy

SIL - Solid immersion lens

SIM - Solid immersion mirror

SIMS - Secondary ion mass spectrometry

SNMS - Sputtered neutral species mass spectrometry

SNOM - Scanning near-field optical microscopy

SPECT - Single photon emission computed tomography

SPM - Scanning probe microscopy

SRM-CE/MS - Selected-reaction-monitoring capillary-electrophoresis mass-spectrometry

SSNMR - Solid-state nuclear magnetic resonance

Stark spectroscopy - Stark spectroscopy

STED - Stimulated Emission Depletion microscopy

STEM - Scanning transmission electron microscopy

STM - Scanning tunneling microscopy

STS - Scanning tunneling spectroscopy

SXRD - Surface X-ray Diffraction (SXRD)

T

TAT or TACT - Thermoacoustic tomography or thermoacoustic computed tomography (see also photoacoustic tomography - PAT)

TEM - transmission electron microscope/microscopy

TGA - Thermogravimetric analysis

TIKA - Transmitting ion kinetic analysis

TIMS - Thermal ionization mass spectrometry

TIRFM - Total internal reflection fluorescence microscopy

TLS - Photothermal lens spectroscopy, a type of Photothermal spectroscopy

TMA - Thermomechanical analysis

TOF-MS - Time-of-flight mass spectrometry

Two-photon excitation microscopy - Two-photon excitation microscopy

TXRF - Total reflection X-ray fluorescence analysis

U

Ultrasound attenuation spectroscopy - Ultrasound attenuation spectroscopy

Ultrasonic testing - Ultrasonic testing

UPS - UV-photoelectron spectroscopy

USANS - Ultra small-angle neutron scattering

USAXS - Ultra small-angle X-ray scattering

UV-Vis - Ultraviolet–visible spectroscopy

V

VEDIC - Video-enhanced differential interference contrast microscopy

Voltammetry - Voltammetry

W

WAXS - Wide angle X-ray scattering

WDX or WDS - Wavelength dispersive X-ray spectroscopy

X

XAES - X-ray induced Auger electron spectroscopy

XANES - XANES, synonymous with NEXAFS (Near edge X-ray absorption fine structure)

XAS - X-ray absorption spectroscopy

X-CTR - X-ray crystal truncation rod scattering

X-ray crystallography - X-ray crystallography

XDS - X-ray diffuse scattering

XPEEM - X-ray photoelectron emission microscopy

XPS - X-ray photoelectron spectroscopy

XRD - X-ray diffraction

XRES - X-ray resonant exchange scattering

XRF - X-ray fluorescence analysis

XRR - X-ray reflectivity

XRS - X-ray Raman scattering

XSW - X-ray standing wave technique