Abbreviated title (ISO 4) X Ray Spectrom. Language English Publisher John Wiley & Sons | Discipline X-ray spectrometry Edited by R. Van Grieken Publication history 1972-present | |
X-Ray Spectrometry is a bimonthly peer-reviewed scientific journal established in 1972 and published by John Wiley & Sons. It covers the theory and application of X-ray spectrometry. The current editor-in-chief is R. Van Grieken (University of Antwerp).
Contents
Abstracting and indexing
The journal is abstracted and indexed in:
According to the Journal Citation Reports, the journal has a 2011 impact factor of 1.445, ranking it 25th out of 42 journals in the category "Spectroscopy".
Notable articles
The highest-cited articles from this journal are:
- Vekemans, B.; Janssens, K.; Vincze, L.; Adams, F.; Van Espen, P. (1994). "Analysis of X-ray spectra by iterative least squares (AXIL): New developments". X-Ray Spectrometry. 23 (6): 278. doi:10.1002/xrs.1300230609.
- Packwood, R. H.; Brown, J. D. (1981). "A Gaussian expression to describe φ(ρz) curves for quantitative electron probe microanalysis". X-Ray Spectrometry. 10 (3): 138. doi:10.1002/xrs.1300100311.
- Norrish, K.; Hutton, J. T. (1977). "Plant analyses by X-ray spectrometry I—Low atomic number elements, sodium to calcium". X-Ray Spectrometry. 6: 6. doi:10.1002/xrs.1300060104.
References
X-Ray Spectrometry (journal) Wikipedia(Text) CC BY-SA